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The probe card provides a mechanical and electrical "bridge" to connect the DUT and the tester.
While semiconductor devices are required to be higher density,higher speed, and streamlined higher throughput,probe card is one of the key factors for reliable wafer test. MJC/MMK offers several types of high quality probe cards that meet each customer's various requirement and different test environment.
Package Probe (Test Soeket)
Package Probe is Test Socket to check the LSI packaged device mounted on the handler. Our test socket,"J-Contacts" is suitable for measuring high frequency devices such as cellular phone devices and mobile devices. Uniquely designed spring probe "BeeContacts" ard provided.
A wafer prober is a system that enables a wafer to come into contact with a probe to transmit electrical signals from a tester or measuring instrument for the purpose of evaluating properties and conducting a go/no-go test.
MJC's extensive lineup includes manual probers for R&D and automatic probers for production testing.