MJC's advanced MEMS "Micro Cantilever" probe card
technology built using proprietary "thin film multi-layer" processes.
● High parallelism memory device test capabilities.
● Full area array testing with a 300mm (12-inch）single touch probe card.
● Scalability for 2,000DUTs and up to 120,000pins on a single probe card.
● Efficient DUT layout for reducing test cost.