U-Probe for DRAM

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MJC's advanced MEMS "Micro Cantilever" probe card

technology built using proprietary "thin film multi-layer" processes.


● High parallelism memory device test capabilities.

● Full area array testing with a 300mm (12-inch)single touch probe card.

● Scalability for 2,000DUTs and up to 120,000pins on a single probe card.

● Efficient DUT layout for reducing test cost.

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产品详情

MJC's advanced MEMS "Micro Cantilever" probe card

technology built using proprietary "thin film multi-layer" processes.


● High parallelism memory device test capabilities.

● Full area array testing with a 300mm (12-inch)single touch probe card.

● Scalability for 2,000DUTs and up to 120,000pins on a single probe card.

● Efficient DUT layout for reducing test cost.

U-Probe for DRAM

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U-Probe for DRAM

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