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MEMS-SP
This probe card has spring type probe fabricated by MEMS process. It is suitable for flip chip devices such as microprocessor or Soc. Single pin replacement is easy with simple maintenance. Moreover, it’s suitable for high frequency direct docking test
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Vertical-Probe
Vertical type probe card is suitable for high density and high speed logic and SoC wafer test. It’s flexible layout can meet to all pad arrangements, and is suitable for a fine pitch and high parallel testing. Moreover, single needle replacement is easy a
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