Vertical-Probe

Vertical type probe card is suitable for high density and high speed logic and SoC wafer test. It’s flexible layout can meet to all pad arrangements, and is suitable for a fine pitch and high parallel testing. Moreover, single needle replacement is easy a

Vertical-Probe

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Vertical type probe card is suitable for high density and high speed logic and SoC wafer test. It’s flexible layout can meet to all pad arrangements, and is suitable for a fine pitch and high parallel testing. Moreover, single needle replacement is easy and excellent in maintenance.


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产品详情

Vertical type probe card is suitable for high density and high speed logic and SoC wafer test. It’s flexible layout can meet to all pad arrangements, and is suitable for a fine pitch and high parallel testing. Moreover, single needle replacement is easy and excellent in maintenance.


Vertical-Probe
Vertical type probe card is suitable for high density and high speed logic and SoC wafer test. It’s flexible layout can meet to all pad arrangements, and is suitable for a fine pitch and high parallel testing. Moreover, single needle replacement is easy a
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Vertical-Probe

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